Scanning Acoustic Microscopy (SAM): A Robust Method for Defect Detection during the Manufacturing Process of Ultrasound Probes for Medical Imaging/Bertocci F

Please use this identifier to cite or link to this item: http://dspace.hmtu.edu.vn/handle/DHKTYTHD_123/11387

Full metadata record

DC Field	Value	Language
dc.contributor.author	F, Bertocci	-
dc.date.accessioned	2022-04-06T02:10:24Z	-
dc.date.available	2022-04-06T02:10:24Z	-
dc.date.issued	2019	-
dc.identifier.uri	http://dspace.hmtu.edu.vn/handle/DHKTYTHD_123/11387	-
dc.description	Chính văn tài liệu	vi
dc.language.iso	en	vi
dc.publisher	MDP	vi
dc.subject	quality improvement	vi
dc.subject	industrial applications	vi
dc.title	Scanning Acoustic Microscopy (SAM): A Robust Method for Defect Detection during the Manufacturing Process of Ultrasound Probes for Medical Imaging/Bertocci F	vi
dc.type	Article	vi
Appears in Collections	Tạp chí Tiếng anh Y khoa

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