Please use this identifier to cite or link to this item:
http://dspace.hmtu.edu.vn/handle/DHKTYTHD_123/15740Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Goldstein, Joseph I. | - |
| dc.date.accessioned | 2023-02-06T01:47:26Z | - |
| dc.date.available | 2023-02-06T01:47:26Z | - |
| dc.date.issued | 2018 | - |
| dc.identifier.uri | http://dspace.hmtu.edu.vn/handle/DHKTYTHD_123/15740 | - |
| dc.description | Chính văn tài liệu | vi |
| dc.language.iso | en | vi |
| dc.publisher | Springer Science+Business Media | vi |
| dc.subject | X-Ray Microanalysis | vi |
| dc.subject | Electron Microscopy | vi |
| dc.title | Scanning Electron Microscopy and X-Ray Microanalysis, Fourth Edition | vi |
| dc.type | Book | vi |
| Appears in Collections | Khoa Chẩn đoán hình ảnh | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Scanning Electron Microscopy and X-Ray Microanalysis.pdf Restricted Access | 66.74 MB | Adobe PDF | Request Item |
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