Please use this identifier to cite or link to this item:
http://dspace.hmtu.edu.vn/handle/DHKTYTHD_123/15740| Title: | Scanning Electron Microscopy and X-Ray Microanalysis, Fourth Edition |
| Authors: | Goldstein, Joseph I. |
| Keywords: | X-Ray Microanalysis Electron Microscopy |
| Issue Date: | 2018 |
| Publisher: | Springer Science+Business Media |
| Description: | Chính văn tài liệu |
| URI: | http://dspace.hmtu.edu.vn/handle/DHKTYTHD_123/15740 |
| Appears in Collections | Khoa Chẩn đoán hình ảnh |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Scanning Electron Microscopy and X-Ray Microanalysis.pdf Restricted Access | 66.74 MB | Adobe PDF | Request Item |
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